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Article

Open Access

Rough Surfaces Profiles and Speckle Patterns Analysis by Hurst Exponent Method

Author(s)

Oscar Sarmiento Martinez1, José A. Marban Salgado2, Darwin Mayorga Cruz2, Jorge Uruchurtu Chavarin2 and Estela Sarmiento Bustos3

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DOI:10.17265/2161-6221/2013.12.002

Affiliation(s)

1. Zacatepec Technology Institute, Metalmechanics Departament, Electromechanics Engineering. Calzada Tecnologico No. 27, Zacatepec Morelos, C.P. 62780, México 2. Center for Research in Engineering and Applied Sciences, Av. Universidad 1001, Chamilpa, Cuernavaca Morelos, C.P. 62209, Mexico 3. Technological University Emiliano Zapata, Mechanical and Industrial Area, Av. Universidad Tecnologica No. 1, Col. Palo Escrito, Emiliano Zapata, Morelos, C.P. 62760, Mexico

ABSTRACT

In this work, a conventional surface roughness comparator is used to perform an analysis of different textures. The Hurst exponent method for the characterization of optical profiles and speckle digital patterns obtained from the comparator was used. By implementation of a simple experimental setup with minimum alignment, information about specific points on the comparator for different roughness was obtained. The processing and analysis of optical signals and images obtained by reflection allowed calculation of Hurst coefficients, revealing a relation between surface roughness, optical profiles and speckle patterns. The setup simplicity and Hurst analysis suggest their combined application on surface metrology.

KEYWORDS

Roughness, optical data processing, Hurst exponent, speckle patterns.

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